DocumentCode
1586714
Title
Decision support system for high temperature electronics
Author
McCluskey, Patrick ; Osterman, Michael ; Jain, Ritesh ; Tiwari, Nivedan ; Grzybowski, Richard ; Lin, Ted ; Benoit, Jeff
Author_Institution
Maryland Univ., College Park, MD, USA
fYear
1998
Firstpage
176
Lastpage
180
Abstract
Small signal electronics have traditionally been designed to operate at temperatures below 85°C. This has become a severe constraint in the development of electronic systems for next generation products, such as the hybrid electric vehicle, and the high speed civil transport. Recent advances in components and packaging material technology have now made possible the design of electronic systems which will operate at ambient temperatures of 200°C, without the need for active cooling. However, cost-effectively ensuring that these systems are reliable at these temperatures over a typical lifetime of a decade or more requires that reliability considerations be addressed in the earliest phases of design. In this paper we will discuss a methodology and an associated decision support system that has been developed to facilitate design-for-reliability specifically for high temperature electronic systems. This system is the only design-for-reliability decision support system that can assess the time to failure of electronic system designs at high temperatures based on models of the fundamental mechanisms by which systems fail at those temperatures
Keywords
circuit CAD; circuit reliability; decision support systems; failure analysis; high-temperature electronics; 200 C; decision support system; design for reliability; high temperature electronics; small signal electronics; time to failure; Actuators; Aerospace control; Centralized control; Control systems; Decision support systems; Distributed control; Electronics cooling; Electronics packaging; Hybrid electric vehicles; Temperature sensors;
fLanguage
English
Publisher
ieee
Conference_Titel
High Temperature Electronics Conference, 1998. HITEC. 1998 Fourth International
Conference_Location
Albuquerque, NM
Print_ISBN
0-7803-4540-1
Type
conf
DOI
10.1109/HITEC.1998.676784
Filename
676784
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