Title :
Dipole localization of eeg and its application to detection of origin of epilepsy
Author :
Yamanoi, Takahiro ; Yamazaki, Toshimasa
Abstract :
The paper introduces a confidential region proposed by T. Yamazaki et al., which is equipped with the equivalent dipole source localization software; SinaPointPro (NEC Corporation). This confidence limit is defined on a direction of the radius. This method enables to detect the origin of the epilepsy. And also the paper treats a series of its applications by the present author. The author and his collaborators have recorded electroencephalograms (EEGs) from subjects viewing four types of Kanji and arrows representing directional meaning. Subjects were asked to read them silently. The equivalent current dipole source localization (ECDL) method has been applied to these event related potentials: averaged EEGs. ECDs were localized to the right and left frontal lobes at latency after 500ms in both cases. Polarities of ERPs were also opposite in the case of opposite directions, and the moments of localized ECDs at these latencies were opposite. Pathways of ECDs in silent reading are almost the same in cases of Kanji and arrow. In these cases, no ECD was localized to the Wernike´s area and the angler gyrus those are related to the auditory language area, however, ECDs were localized to the Broca´s area that is said to be the language area for speech.
Keywords :
brain; electroencephalography; medical diagnostic computing; medical disorders; neurophysiology; visual evoked potentials; Broca area; EEG; Kanji case; NEC Corporation; SinaPointPro; Wernike area; angler gyrus; dipole source localization software; electroencephalograms; epilepsy; equivalent current dipole source localization; event related potentials; language area; left frontal lobe; right frontal lobe; speech; time 500 ms; Confidential Limit; Directional Visual Stimulus; EEG; Equivalent Current Dipole Source Localization Method; Event Related Potential; Silent Reading.; Vision Evoked Potential;
Conference_Titel :
World Automation Congress (WAC), 2010
Conference_Location :
Kobe
Print_ISBN :
978-1-4244-9673-0
Electronic_ISBN :
2154-4824