Study of a BIST Technique for CMOS Active Pixel Sensors

Author

Lizarraga, L. ; Mir, S. ; Sicard, G. ; Bounceur, A.

Author_Institution

TIMA Lab., Grenoble

fYear

2006

Firstpage

326

Lastpage

331

Abstract

The production test of CMOS image sensors is complicated and expensive as an electrical and an optical test must be executed for the pixel matrix. In this paper we study a built-in-self-test (BIST) technique for the pixels. The technique is based on applying a voltage stimulus at the photosensitive element of the image sensor. The aim of this work is to avoid light stimuli to realise an only electrical test to determine if a pixel is functional or not. This will then reduce test time and test cost. To quantify the quality of this test approach, test metrics such as fault rejection and fault acceptance are estimated. Catastrophic and parametric faults are taken into consideration for the estimation of the test quality

Keywords

CMOS image sensors; built-in self test; cost reduction; integrated circuit testing; mixed analogue-digital integrated circuits; production testing; BIST; CMOS active pixel sensors; CMOS image sensors; built-in-self-test technique; catastrophic faults; electrical test; fault acceptance; fault rejection; parametric faults; production test; reduced test cost; reduced test time; test metrics; test quality estimation; voltage stimulus; Built-in self-test; CMOS image sensors; CMOS technology; Costs; Image sensors; Optical sensors; Pixel; Production; Testing; Voltage;

fLanguage

English

Publisher

ieee

Conference_Titel

Very Large Scale Integration, 2006 IFIP International Conference on

Conference_Location

Nice

Print_ISBN

3-901882-19-7

Type

conf

DOI

10.1109/VLSISOC.2006.313255

Filename

4107651