Title :
Structural Analysis of R & D Division from Patent Documents
Author :
Iino, Yurie ; Yamada, Yasuhiro ; Hirokawa, Sachio
Author_Institution :
Grad. Sch. of Inf. Sci. & Electr. Eng., Kyushu Univ.
Abstract :
This paper describes a method to draw the network of inventors and their technology. It is based on the co-occurrence analysis of inventors of a company described in their patent documents. Empirical evaluation, using 16,375 cosmetic related patent documents, shows that the method discloses the structure of research and development activities of companies.
Keywords :
electronic commerce; patents; research and development; R & D division; cooccurrence analysis; inventors; patent documents; structural analysis; Companies; Computer science; Information analysis; Information science; Information technology; Intellectual property; Mathematics; Research and development; Spatial databases; Technology management; co-inventor; concept graph; patent;
Conference_Titel :
e-Business Engineering, 2008. ICEBE '08. IEEE International Conference on
Conference_Location :
Xi´an
Print_ISBN :
978-0-7695-3395-7
DOI :
10.1109/ICEBE.2008.29
