DocumentCode
1587251
Title
Fundamental studies of dielectric characteristics of heat-injured s. cerevisiae using dielectrophoretic impedance measurement method
Author
Enjoji, Takaharu ; Uchida, Satoshi ; Tochikubo, Fumiyoshi
Author_Institution
Tokyo Metropolitan Univ., Tokyo, Japan
fYear
2010
Firstpage
1
Lastpage
6
Abstract
Rapid and high sensitivity methods for microorganism detection and constant monitoring system in fermentation processes have been required for advanced quality preservation in food and beverage industries. In the present work, the metabolic states of heat-injured Saccharomyces cerevisiae (S. cerevisiae) in a micro-cell were investigated using dielectrophoretic impedance measurement (DEPIM) method. Temporal change in the conductance between micro-gap (ΔG) was measured for various heat treatment temperatures (HTT). As a result, there is an obvious correlation between HTT and ΔG as well as our previous works for Escherichia coli (E. coli). These results suggest that DEPIM method should be available for an effective monitoring method for complex change in various biological states of microorganisms.
Keywords
electric impedance measurement; electrophoresis; fermentation; heat treatment; microorganisms; process monitoring; Escherichia coli; advanced quality preservation; beverage industries; conductance; constant monitoring system; dielectric characteristics; dielectrophoretic impedance measurement; fermentation processes; food industries; heat treatment temperatures; heat-injured Saccharomyces cerevisiae; metabolic states; microcell; microgap; microorganism detection; sensitivity methods; Dielectrics; Heating; Monitoring; Dielectrophoresis; Impedance measurement method; Metabolism activity;
fLanguage
English
Publisher
ieee
Conference_Titel
World Automation Congress (WAC), 2010
Conference_Location
Kobe
ISSN
2154-4824
Print_ISBN
978-1-4244-9673-0
Electronic_ISBN
2154-4824
Type
conf
Filename
5665336
Link To Document