• DocumentCode
    158730
  • Title

    High voltage breakdown phenomena in RF window, electron gun and RF cavities in 250 kW CW C band klystron and their preventive measures

  • Author

    Lamba, O.S. ; Badola, Richa ; Baloda, Suman ; Pal, Debdas ; Bandopadhyay, A. ; Saxena, V.K. ; Joshi, L.M.

  • Author_Institution
    Central Electron. Eng. Res. Inst., Pilani, India
  • fYear
    2014
  • fDate
    Sept. 28 2014-Oct. 3 2014
  • Firstpage
    21
  • Lastpage
    23
  • Abstract
    The paper describes voltage break down phenomenon and preventive measures in components of 250 KW CW, C band klystron under development at CEERI Pilani. The klystron operates at a beam voltage of 50 kV and delivers 250 kW RF power at 5GHz frequency. The klystron consists of several key components and regions, which are subject to high electrical stress. The most important regions of electrical breakdown are electron gun, the RF ceramic window and output cavity gap area. In the critical components voltage breakdown considered at design stage by proper gap and other techniques. All these problems discussed, as well as solution to alleviate this problem. The electron gun consists basically of cathode, BFE and anode. The cathode is operated at a voltage of 50 kV. In order to maintain the voltage standoff between cathode and anode a high voltage alumina seal and RF window have been designed developed and successfully used in the tube.
  • Keywords
    circular waveguides; electric breakdown; electron guns; klystrons; BFE; CEERI Pilani; CW C band klystron; RF ceramic window; anode; cathode; electrical breakdown; electron gun; frequency 5 GHz; high voltage alumina seal; output cavity gap area; power 250 kW; voltage 50 kV; voltage breakdown phenomenon; Cavity resonators; Coatings; Dielectric breakdown; Klystrons; Radio frequency; Tin;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Discharges and Electrical Insulation in Vacuum (ISDEIV), 2014 International Symposium on
  • Conference_Location
    Mumbai
  • Print_ISBN
    978-1-4799-6750-6
  • Type

    conf

  • DOI
    10.1109/DEIV.2014.6961609
  • Filename
    6961609