Title :
Review, comparison and outlook of test bus
Author :
Sheng, Miao ; Chengwen, Lin ; Enquan, Guo
Author_Institution :
Shaanxi Hitech Electron. Co. Ltd., Xi´´an, China
Abstract :
Test bus is not only the data transmission channel of instrument, but also the nuclear technology supporting the development of Automatic Test System (ATS). Since 1970s, many test buses have come into being, such as GPIB, VXI, PXI, PXIe, and AXIe etc. Based on the review of typical test buses, the author analyzes and compares the characteristics of PXIe, LXI and AXIe as the focus. Finally, the future development of test bus has been discussed.
Keywords :
automatic test equipment; AXIe; LXI; PXIe; automatic test system; data transmission channel; nuclear technology; test bus; Bandwidth; Consumer electronics; Delay; Instruments; Local area networks; Protocols; ATS; AXIe; GPIB; LXI; PXI; PXIe; VXI; test bus;
Conference_Titel :
Electronic Measurement & Instruments (ICEMI), 2011 10th International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-8158-3
DOI :
10.1109/ICEMI.2011.6037799
