Title :
Study on electrical lifespan of VI by means of calculation of arc energy during arcing time in synthetic tests
Author :
Byoung-Chul Kim ; Sung-Tae Kim ; Kil-Young Ahn ; Jong-Ho Lee
Author_Institution :
Electro-Technol. R&D Center, LSIS Co., Ltd., Cheong-Ju, South Korea
fDate :
Sept. 28 2014-Oct. 3 2014
Abstract :
This study focused on the evaluation of electrical lifespan of vacuum interrupter by means of calculation of arc energy during arcing time. The repetitive short circuit current breaking tests with synthetic test devices were conducted until the contact could not break the short circuit current to identify the limit of electrical life. As a result, the accumulative arc energy was calculated after tests. Moreover, arc energy in short circuit current breaking tests were calculated and compared with the results of synthetic tests.
Keywords :
arcs (electric); short-circuit currents; vacuum interrupters; accumulative arc energy; arc energy calculation; arcing time; electrical lifespan; repetitive short circuit current breaking test; synthetic test devices; vacuum interrupter; Contacts; IEC standards; Interrupters; Short-circuit currents; Spirals; Vacuum arcs; Voltage measurement;
Conference_Titel :
Discharges and Electrical Insulation in Vacuum (ISDEIV), 2014 International Symposium on
Conference_Location :
Mumbai
Print_ISBN :
978-1-4799-6750-6
DOI :
10.1109/DEIV.2014.6961642
