DocumentCode
1587856
Title
High quality InAs quantum dot lasers on germanium substrates
Author
Shumin Wang ; Qian Gong ; Peng Wang ; Chunfang Cao ; Yaoyao Li
Author_Institution
Shanghai Inst. of Microsyst. & Inf. Technol., Shanghai, China
fYear
2015
Firstpage
1
Lastpage
3
Abstract
InAs/GaAs quantum dot (QD) laser structures were fabricated using gas source molecular beam epitaxy (GSMBE) on Ge (100) substrate. Low temperature grown GaAs buffer layer prevented formation of anti-phase domain (APD). Growth temperature and deposition thickness of InAs were optimized, respectively. Active region consists of five stacked InAs QD layers separated by 40 nm GaAs space layer. Ridge waveguide laser diodes with a strip with of 8 μm were fabricated. Room temperature continuous wave (RT CW) emission was achieved with lasing wavelength centred at 1.05 μm and maximum laser output power reached up to 110 mW from single facet without any facet coating. Performance of similar laser diodes on Ge and GaAs substrates was compared and the laser characteristic temperature for both devices was found similar.
Keywords
III-V semiconductors; antiphase boundaries; buffer layers; chemical beam epitaxial growth; gallium arsenide; indium compounds; quantum dot lasers; ridge waveguides; waveguide lasers; APD; GSMBE; Ge; InAs-GaAs; QD laser structure; RT CW emission; antiphase domain; gas source molecular beam epitaxy; germanium substrate; high quality quantum dot laser; ridge waveguide laser diode; room temperature continuous wave; size 40 nm; size 8 mum; temperature 293 K to 298 K; wavelength 1.05 mum; Diode lasers; Gallium arsenide; Molecular beam epitaxial growth; Power generation; Substrates; Temperature; InAs quantum dot; germanium substrate; laser; molecular beam epitaxy;
fLanguage
English
Publisher
ieee
Conference_Titel
Transparent Optical Networks (ICTON), 2015 17th International Conference on
Conference_Location
Budapest
Type
conf
DOI
10.1109/ICTON.2015.7193404
Filename
7193404
Link To Document