Title :
Timing and power optimization by gate sizing considering false path
Author :
Chen, Guangqiu ; Onodera, Hidetoshi ; Tamaru, Keikichi
Author_Institution :
Dept. of Electron. & Commun., Kyoto Univ., Japan
Abstract :
This paper introduces a new gate sizing approach for area and power optimization considering path sensitization. The approach selects a set of long paths from a combinational circuit by means of a performance optimization oriented heuristic path selection approach. The longest sensitizable path delay of the circuit can be restricted within the specified delay limit if we set the specified delay limit on these paths in an LP based iterative gate sizing process. Since the approach get rid of unnecessary delay constraints on long false paths, results with smaller circuit area or power dissipation is expected. Experiments on benchmark circuits show that the proposed approach can substantially reduce the circuit area and power dissipation by considering path sensitization for some false path dominated circuits
Keywords :
VLSI; circuit layout CAD; circuit optimisation; combinational circuits; delays; integrated circuit layout; integrated logic circuits; iterative methods; logic CAD; timing; LP based iterative gate sizing process; area optimization; combinational circuit; delay constraints; false path; gate sizing; path sensitization; performance optimization oriented heuristic path selection; power dissipation reduction; power optimization; sensitizable path delay; specified delay limit; timing optimization; Circuit synthesis; Combinational circuits; Delay effects; Iterative methods; Optimization; Power dissipation; Process design; Timing; Tuned circuits; Very large scale integration;
Conference_Titel :
VLSI, 1996. Proceedings., Sixth Great Lakes Symposium on
Conference_Location :
Ames, IA
Print_ISBN :
0-8186-7502-0
DOI :
10.1109/GLSV.1996.497612