Title :
Robust locally optimum signal detection in correlated noise using autoregressive modeling
Author :
Mychal, M.R. ; Jacklin, W.E. ; Ucci, D.R. ; Kaczmarski, A.L. ; Banys, M.R.
Author_Institution :
Dept. of Electr. & Comput. Eng., Illinois Inst. of Technol., Chicago, IL, USA
fDate :
6/21/1905 12:00:00 AM
Abstract :
This work describes a robust locally optimum (LO) detector for signal reception in correlated interference and thermal noise using autoregressive modeling methods. The noise environment is modeled as a P th-order autoregressive (AR(P)) process. The AR model parameters are computed using standard spectral estimation techniques. The bit error rate performance for the resulting autoregressive locally optimum (ARLO) processor is presented for a binary phase shift keyed (BPSK) communication system
Keywords :
autoregressive processes; correlation methods; error statistics; interference (signal); parameter estimation; phase shift keying; signal detection; thermal noise; AR model parameters; BER performance; BPSK communication system; Pth-order autoregressive process; autoregressive locally optimum processor; autoregressive modeling; binary phase shift keying; bit error rate performance; correlated interference; correlated noise; robust locally optimum detector; signal detection; signal reception; spectral estimation techniques; thermal noise; Binary phase shift keying; Bit error rate; Computer industry; Detectors; Interference; Noise robustness; Probability density function; Signal detection; Thermal engineering; Working environment noise;
Conference_Titel :
Military Communications Conference Proceedings, 1999. MILCOM 1999. IEEE
Conference_Location :
Atlantic City, NJ
Print_ISBN :
0-7803-5538-5
DOI :
10.1109/MILCOM.1999.821416
