Title :
Vacuum arc deposition using refractory electrodes
Author :
Beilis, Isak I. ; Koulik, Y. ; Yankelevich, E. ; Arbilly, D. ; Boxman, R.L.
Author_Institution :
Electr. Discharge & Plasma Lab., Tel Aviv Univ., Tel Aviv, Israel
fDate :
Sept. 28 2014-Oct. 3 2014
Abstract :
Refractory metal plasma generated by a vacuum arc was used to deposit thin films. The deposition rate Vdep was measured for different electrode configurations: (1) a planar Zr cathode and a planar W anode-both 60mm diam, (2) 32 mm diam cylindrical W or Mo electrode pairs, and a (3) Nb cylindrical cathode (32 mm diam) closed by a BN plate and a 50 mm diam W shower-head cup anode with either (a) an array of 1 mm diameter exit holes or (b) one 4 mm diam hole Ta cup anode. For Zr films, Vdep was 0.8 μm/min at a distance 110 mm from the electrode axis at 90 s after arc ignition. For W films at 60 s after ignition and the planar electrode configuration, Vdep was 0.6 μm/min at a distance of 60 mm from the electrode axis. For Nb films deposited with the closed electrode configuration, Vdep was 0.3 μm/min at distance 80 mm from the front shower anode surface at 30 s after arc ignition. For cylindrical Mo electrode pair Vdep was about 0.4 μm/min at a distance of 110 mm, 70 s after 200 A arc ignition.
Keywords :
metallic thin films; molybdenum; niobium; plasma production; tantalum; tungsten; vacuum arcs; vacuum deposition; zirconium; Mo; Nb; W; Zr; closed electrode configuration; cylindrical cathode; electrode axis; electrode configuration; electrode pairs; front shower anode surface; planar anode; planar cathode; planar electrode configuration; refractory electrodes; refractory metal plasma generation; shower-head cup anode; size 1 mm; size 110 nm; size 32 nm; size 4 mm; size 50 mm; size 60 nm; size 80 mm; thin films; time 30 s; vacuum arc deposition; Anodes; Cathodes; Films; Ignition; Plasmas; Vacuum arcs;
Conference_Titel :
Discharges and Electrical Insulation in Vacuum (ISDEIV), 2014 International Symposium on
Conference_Location :
Mumbai
Print_ISBN :
978-1-4799-6750-6
DOI :
10.1109/DEIV.2014.6961732