Title :
Design and implementation of a test system for a new QDUC
Author :
Shouguo, Yang ; Kunhui, Zhang ; Yong, Li ; Weiping, Tang ; Xiang, Gao
Author_Institution :
Sch. of Electron. & Inf., Northwestern Polytech. Univ., Xi´´an, China
Abstract :
With the widely use of digital integration chip (IC), it becomes more and more important to design and develop a test system for special chip. A test system for a new QDUC (Quadrature Digital Upconverter) -AD9957 chip based on MCU and CPLD is designed in this paper. Firstly, the principle and application of AD9957 are introduced briefly. Then the design idea and principle of the system are mainly explained. The paper also presents the structure of hardware, the flow chart of software and the test results. The system has many advantages such as simple structure, practicality and favorable application prospect.
Keywords :
data conversion; test equipment; CPLD; MCU; QDUC; digital integration chip; quadrature digital upconverter; special chip; test system; Baseband; Educational institutions; Instruments; Interpolation; Modulation; Performance evaluation; Random access memory; AD9957; CPLD; MCU; QUDC; test system;
Conference_Titel :
Electronic Measurement & Instruments (ICEMI), 2011 10th International Conference on
Conference_Location :
Chengdu
Print_ISBN :
978-1-4244-8158-3
DOI :
10.1109/ICEMI.2011.6037866
