• DocumentCode
    1588986
  • Title

    Adjustment of vision system parameters and image processing algorithms for measurement of miniature parts in automatic assembly

  • Author

    Xiaodong, Wang ; Yong, Chen ; Yi, Luo ; Liang, Chen ; Tianming, Ma ; Lin, Teng

  • Author_Institution
    Key Lab. for Micro/Nano Technol. & Syst. of Liaoning Province, Dalian Univ. of Technol., Dalian, China
  • Volume
    3
  • fYear
    2011
  • Firstpage
    113
  • Lastpage
    118
  • Abstract
    Automatic assembly in the small world presents many challenges. In order to fulfill precise measurement with limitation of vision field, diversity and severe surface condition of miniature parts, a two-layered architecture with operator interaction is proposed. These two layers specify for user and developer of the assembly application respectively. Based on part´s feature, the former adjusts vision parameters with the interface of dynamic illumination control and the later develops reasonable feature extraction strategy for measurement of part´s position and orientation with an image processing tool. With general image processing algorithms, it can not only be applied by itself, but also be integrated into an assembly system to facilitate developer to adjust image processing strategy. This operator interaction function can improve the accuracy of recognizing and locating part, promote the success ratio of product assembly and shorter the period of software development as well.
  • Keywords
    computer vision; feature extraction; microassembling; production engineering computing; automatic assembly; dynamic illumination control; feature extraction; image processing algorithm; miniature part measurement; operator interaction; product assembly; software development; two-layered architecture; vision system parameter; Assembly; Feature extraction; Image edge detection; Machine vision; Visualization; automatic assembly; human-robot interaction; image processing; vision based measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Measurement & Instruments (ICEMI), 2011 10th International Conference on
  • Conference_Location
    Chengdu
  • Print_ISBN
    978-1-4244-8158-3
  • Type

    conf

  • DOI
    10.1109/ICEMI.2011.6037867
  • Filename
    6037867