• DocumentCode
    1589154
  • Title

    Test generation for networks of interacting FSMs using symbolic techniques

  • Author

    Ferrandi, F. ; Fummi, F. ; Macii, E. ; Poncino, M. ; Sciuto, D.

  • Author_Institution
    Dipartimento di Elettronica, Politecnico di Milano, Italy
  • fYear
    1996
  • Firstpage
    208
  • Lastpage
    213
  • Abstract
    This paper presents a new testing strategy for networks of interacting FSMs. The approach allows us to generate test patterns for faults in the network by separately handling the network´s components. The proposed algorithms are fully symbolic; therefore, they allow the manipulation of large designs. Experimental results, though preliminary, are promising
  • Keywords
    Boolean functions; fault diagnosis; finite state machines; logic testing; symbol manipulation; faults; interacting FSMs; symbolic techniques; test generation; test patterns; testing strategy; Algorithm design and analysis; Automata; Automatic testing; Boolean functions; Circuit faults; Circuit testing; Data structures; Logic testing; State-space methods; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI, 1996. Proceedings., Sixth Great Lakes Symposium on
  • Conference_Location
    Ames, IA
  • ISSN
    1066-1395
  • Print_ISBN
    0-8186-7502-0
  • Type

    conf

  • DOI
    10.1109/GLSV.1996.497621
  • Filename
    497621