Title :
Test generation for networks of interacting FSMs using symbolic techniques
Author :
Ferrandi, F. ; Fummi, F. ; Macii, E. ; Poncino, M. ; Sciuto, D.
Author_Institution :
Dipartimento di Elettronica, Politecnico di Milano, Italy
Abstract :
This paper presents a new testing strategy for networks of interacting FSMs. The approach allows us to generate test patterns for faults in the network by separately handling the network´s components. The proposed algorithms are fully symbolic; therefore, they allow the manipulation of large designs. Experimental results, though preliminary, are promising
Keywords :
Boolean functions; fault diagnosis; finite state machines; logic testing; symbol manipulation; faults; interacting FSMs; symbolic techniques; test generation; test patterns; testing strategy; Algorithm design and analysis; Automata; Automatic testing; Boolean functions; Circuit faults; Circuit testing; Data structures; Logic testing; State-space methods; System testing;
Conference_Titel :
VLSI, 1996. Proceedings., Sixth Great Lakes Symposium on
Conference_Location :
Ames, IA
Print_ISBN :
0-8186-7502-0
DOI :
10.1109/GLSV.1996.497621
