DocumentCode
1589477
Title
A new method for building solder bumps for advanced packaging
Author
Dishon, Giora J.
Author_Institution
Microelectron. Center of North Carolina, Research Triangle Park, NC, USA
fYear
1988
Firstpage
112
Abstract
Summary form only given. The two basic approaches that are currently being used to build solder bumps-wet electroplating and dry evaporation-are subject to strong limitations that prevent a wider application throughout the electronics industry. These limitations are nonuniformities and impurities for the electroplating process, and large investments for process development and production implementation for the evaporation-through-metal-mask process. At MCNC, a method of building small-size (d approximately 1 mil) solder bumps is being developed. The process utilizes conventional thin-film equipment and processes, and soldering equipment and processes. High-yield solder-bumped wafers and/or substrates can be obtained. The process outline and results are presented.<>
Keywords
packaging; soldering; MCNC; advanced packaging; electronics industry; impurities; nonuniformities; process development; production implementation; solder bumps; thin-film equipment; yield; Capacitance; Connectors; Electric resistance; Electronics industry; Impurities; Inductance; Investments; Microelectronics; Packaging; Production;
fLanguage
English
Publisher
ieee
Conference_Titel
Electronic Manufacturing Technology Symposium, 1988, Design-to-Manufacturing Transfer Cycle. Fifth IEEE/CHMT International
Conference_Location
Lake Buena Vista, FL, USA
Type
conf
DOI
10.1109/EMTS.1988.16160
Filename
16160
Link To Document