• DocumentCode
    1589477
  • Title

    A new method for building solder bumps for advanced packaging

  • Author

    Dishon, Giora J.

  • Author_Institution
    Microelectron. Center of North Carolina, Research Triangle Park, NC, USA
  • fYear
    1988
  • Firstpage
    112
  • Abstract
    Summary form only given. The two basic approaches that are currently being used to build solder bumps-wet electroplating and dry evaporation-are subject to strong limitations that prevent a wider application throughout the electronics industry. These limitations are nonuniformities and impurities for the electroplating process, and large investments for process development and production implementation for the evaporation-through-metal-mask process. At MCNC, a method of building small-size (d approximately 1 mil) solder bumps is being developed. The process utilizes conventional thin-film equipment and processes, and soldering equipment and processes. High-yield solder-bumped wafers and/or substrates can be obtained. The process outline and results are presented.<>
  • Keywords
    packaging; soldering; MCNC; advanced packaging; electronics industry; impurities; nonuniformities; process development; production implementation; solder bumps; thin-film equipment; yield; Capacitance; Connectors; Electric resistance; Electronics industry; Impurities; Inductance; Investments; Microelectronics; Packaging; Production;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Manufacturing Technology Symposium, 1988, Design-to-Manufacturing Transfer Cycle. Fifth IEEE/CHMT International
  • Conference_Location
    Lake Buena Vista, FL, USA
  • Type

    conf

  • DOI
    10.1109/EMTS.1988.16160
  • Filename
    16160