Title :
Learning multiple fault diagnosis
Author :
El Fattah, Yousri ; O´Rorke, Paul
Author_Institution :
Dept. of Inf. & Comput. Sci., California Univ., Irvine, CA, USA
Abstract :
The authors describe two methods for integrating model-based diagnosis (MBD) and explanation-based learning (EBL). The first method, EBL, uses a generate-test-debug paradigm, generating diagnostic hypotheses using learned associational rules that summarize model-based diagnostic experiences. This strategy is a form of learning while doing model-based troubleshooting and could be called online learning. The second diagnosis and learning method described here (EBL-STATIC) involves learning in advance. Learning begins in a training phase prior to performance or testing. Empirical results of computational experiments comparing the learning methods with MBD on two devices (the polybox and the binary full adder) are reported. For the same diagnostic performance, EBL-STATIC is several orders of magnitude faster than MBD, while EBL can cause performance slow-down
Keywords :
adders; circuit analysis computing; expert systems; explanation; fault location; learning systems; EBL; EBL-STATIC; MBD; associational rules; binary full adder; circuit analysis; explanation-based learning; model-based diagnosis; model-based troubleshooting; multiple fault diagnosis; online learning; polybox; Adders; Artificial intelligence; Circuit faults; Computer science; Digital systems; Fault diagnosis; Learning systems; Machine learning; Testing; Workstations;
Conference_Titel :
Artificial Intelligence Applications, 1991. Proceedings., Seventh IEEE Conference on
Conference_Location :
Miami Beach, FL
Print_ISBN :
0-8186-2135-4
DOI :
10.1109/CAIA.1991.120875