• DocumentCode
    1590008
  • Title

    ADC characterization by an eigenvalues method

  • Author

    Zhang, Jian Qiu ; Ovaska, Seppo J.

  • Author_Institution
    Inst. of Intelligent Power Electron., Helsinki Univ. of Technol., Espoo, Finland
  • Volume
    2
  • fYear
    1998
  • Firstpage
    1198
  • Abstract
    A new method called the eigenvalue method, is introduced in this paper. Here the eigenvalues of the sampling data matrix, directly derived from the sampled input data, are used to characterize the signal-to-noise ratio (SNR), and further to estimate the number of effective bits. Various input signals, such as single-tone, dual-tone, or multi-tone can be used to obtain accurate estimation results. In addition, our new method does not have any of the difficulties and problems of the earlier characterization methods. Extensive simulations indicate that the proposed method provides excellent performance with single-tone, dual-tone, and multi-tone test signals. The proposed eigenvalue method also shows remarkable robustness over a truly wide SNR range (well below 10 dB to somewhat over 160 dB)
  • Keywords
    analogue-digital conversion; eigenvalues and eigenfunctions; integrated circuit testing; singular value decomposition; ADC characterization; dual-tone signals; eigenvalues method; multi-tone signals; robustness; sampled input data; sampling data matrix; signal-to-noise ratio; single-tone signals; test signals; Convergence; Discrete Fourier transforms; Eigenvalues and eigenfunctions; Frequency; Power electronics; Robustness; Sampling methods; Signal to noise ratio; Spectral analysis; Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Instrumentation and Measurement Technology Conference, 1998. IMTC/98. Conference Proceedings. IEEE
  • Conference_Location
    St. Paul, MN
  • ISSN
    1091-5281
  • Print_ISBN
    0-7803-4797-8
  • Type

    conf

  • DOI
    10.1109/IMTC.1998.676913
  • Filename
    676913