DocumentCode
1590008
Title
ADC characterization by an eigenvalues method
Author
Zhang, Jian Qiu ; Ovaska, Seppo J.
Author_Institution
Inst. of Intelligent Power Electron., Helsinki Univ. of Technol., Espoo, Finland
Volume
2
fYear
1998
Firstpage
1198
Abstract
A new method called the eigenvalue method, is introduced in this paper. Here the eigenvalues of the sampling data matrix, directly derived from the sampled input data, are used to characterize the signal-to-noise ratio (SNR), and further to estimate the number of effective bits. Various input signals, such as single-tone, dual-tone, or multi-tone can be used to obtain accurate estimation results. In addition, our new method does not have any of the difficulties and problems of the earlier characterization methods. Extensive simulations indicate that the proposed method provides excellent performance with single-tone, dual-tone, and multi-tone test signals. The proposed eigenvalue method also shows remarkable robustness over a truly wide SNR range (well below 10 dB to somewhat over 160 dB)
Keywords
analogue-digital conversion; eigenvalues and eigenfunctions; integrated circuit testing; singular value decomposition; ADC characterization; dual-tone signals; eigenvalues method; multi-tone signals; robustness; sampled input data; sampling data matrix; signal-to-noise ratio; single-tone signals; test signals; Convergence; Discrete Fourier transforms; Eigenvalues and eigenfunctions; Frequency; Power electronics; Robustness; Sampling methods; Signal to noise ratio; Spectral analysis; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Instrumentation and Measurement Technology Conference, 1998. IMTC/98. Conference Proceedings. IEEE
Conference_Location
St. Paul, MN
ISSN
1091-5281
Print_ISBN
0-7803-4797-8
Type
conf
DOI
10.1109/IMTC.1998.676913
Filename
676913
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