Title :
System identification for data acquisition characterization
Author :
Vandersteen, Gerd ; Rolain, Yves ; Schoukens, Jolhan
Author_Institution :
Dept. Electr., Vrije Univ., Brussels, Belgium
Abstract :
This paper describes a robust and efficient identification algorithm to identify the nonlinear distortion and the time base distortion of a data acquisition channel using sine wave measurements. The proposed method is compared with existing methods using simulations. Its applicability is demonstrated on measurements of high frequency sampling scopes
Keywords :
data acquisition; electric distortion; identification; data acquisition characterization; high frequency sampling scopes; nonlinear distortion; sine wave measurements; system identification; time base distortion; Data acquisition; Distortion measurement; Frequency; Maximum likelihood estimation; Nonlinear distortion; Robustness; Sampling methods; Signal processing; System identification; Time measurement;
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1998. IMTC/98. Conference Proceedings. IEEE
Conference_Location :
St. Paul, MN
Print_ISBN :
0-7803-4797-8
DOI :
10.1109/IMTC.1998.676917
