• DocumentCode
    1590202
  • Title

    Design and Implementation of a Single-Chip ARM-Based USB Interface JTAG Emulator

  • Author

    Chen, Xuhui ; Zhang, Dengyi ; Yang, Hongyun

  • Author_Institution
    Comput. Sch., Wuhan Univ., Wuhan
  • fYear
    2008
  • Firstpage
    272
  • Lastpage
    275
  • Abstract
    Boundary-scan technology is a popular design-for-test technology, which is used by some embedded chips by means of embedding special boundary scan cells inside the circuits. It allows the debugger to talk via a JTAG port directly to the IC´s core. As more and more chips using the JTAG interface, the application of JTAG emulator becomes frequent. Commercial JTAG emulators using parallel port on the market are usually expensive and inconvenience. This paper describes two methods to design an inexpensive USB interface JTAG emulator based on a single-chip ARM, including theirs hardware and software. One is the GPIO pins of an ARM device are used to generate TAP timing and its USB port is used to communicate with PC. Another is used the SPI interface to generate higher TCK. Result shows that this emulator not only has high speed but also is portable.
  • Keywords
    boundary scan testing; design for testability; field buses; integrated circuit testing; Joint Test Action Group; SPI interface; USB interface JTAG emulator; boundary-scan technology; design-for-test technology; single-chip ARM; special boundary scan cells; Application software; Circuit testing; Computer interfaces; Concurrent computing; Embedded computing; Hardware; Integrated circuit interconnections; Integrated circuit testing; Pins; Universal Serial Bus; JTAG emulator; SPI; USB;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Embedded Computing, 2008. SEC '08. Fifth IEEE International Symposium on
  • Conference_Location
    Beijing
  • Print_ISBN
    978-0-7695-3348-3
  • Type

    conf

  • DOI
    10.1109/SEC.2008.13
  • Filename
    4690761