Title :
A broadband and scalable model for on-chip inductors incorporating substrate and conductor loss effects
Author :
Guo, J.C. ; Tan, T.Y.
Author_Institution :
Dept. of Electron. Eng., Nat. Chiao Tung Univ., Hsinchu, Taiwan
Abstract :
A new T-model is developed to accurately simulate the broadband characteristics of on-Si-chip spiral inductors, up to 20 GHz. The spiral coil and substrate RLC networks built in the model play a key role responsible for conductor loss and substrate loss in the wideband regime, which cannot be accurately described by the conventional π-model. Good match with the measured S-parameters, L(ω), Re(Zin(ω)), and Q(ω) proves the proposed T-model. Besides the broadband feature, scalability is justified by the good match with a linear function of coil numbers for all model parameters employed in the RLC networks. The satisfactory scalability manifest themselves physical parameters rather than curve fitting. A parameter extraction flow is established through equivalent circuit analysis to enable automatic parameter extraction and optimization. This scalable inductor model will facilitate optimization design of on-chip inductor and the accuracy proven up to 20 GHz can improve RF circuit simulation accuracy demanded by broadband design.
Keywords :
RLC circuits; circuit simulation; equivalent circuits; integrated circuit design; integrated circuit modelling; losses; optimisation; radiofrequency integrated circuits; semiconductor device models; thin film inductors; 20 GHz; RF circuit simulation accuracy; RLC networks; S-parameters; T-model; automatic parameter extraction; broadband characteristics; broadband design; broadband scalable model; coil numbers; conductor loss effects; curve fitting; equivalent circuit analysis; model parameters; on-Si-chip spiral inductors; on-chip inductors; optimization design; parameter extraction flow; parameter optimization; physical parameters; scalable inductor model; spiral coil networks; substrate RLC networks; substrate loss effects; wideband regime; Coils; Conductors; Curve fitting; Equivalent circuits; Inductors; Parameter extraction; Scalability; Scattering parameters; Spirals; Wideband;
Conference_Titel :
Radio Frequency integrated Circuits (RFIC) Symposium, 2005. Digest of Papers. 2005 IEEE
Print_ISBN :
0-7803-8983-2
DOI :
10.1109/RFIC.2005.1489883