DocumentCode :
1591297
Title :
Time-base nonlinearity determination using iterated sine-fit analysis
Author :
Stenbakken, Gerard N. ; Deyst, John P.
Author_Institution :
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
Volume :
2
fYear :
1998
Firstpage :
1335
Abstract :
A new method is presented to determine the time-base errors of sampling instruments. The method does not require a time-base error model and thus provides accurate estimates where model-based methods fail. Measurements of sinewaves at multiple phases and frequencies are used as test signals. A harmonic distortion model is used to account for amplitude nonlinearity of the sampling channel. Use of an independent method for estimating the channel noise and jitter allows an accurate estimate of the harmonic order. Methods are presented for separating the harmonics generated by the sampling channel from those generated by the time-base distortion. The use of an iterative sine-fit procedure gives accurate results in a short time. A new weighting procedure is described, which minimizes the error in the estimates. Guidelines are given for selecting good sets of test frequencies. Results are shown for both simulated and real data
Keywords :
analogue-digital conversion; data acquisition; harmonic distortion; iterative methods; jitter; time bases; amplitude nonlinearity; channel noise; harmonic distortion model; iterated sine-fit analysis; iterative sine-fit procedure; jitter; multiple frequencies; multiple phases; sampling instruments; test frequencies; time-base nonlinearity; weighting procedure; Distortion measurement; Frequency measurement; Guidelines; Harmonic distortion; Instruments; Jitter; Noise generators; Phase measurement; Sampling methods; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Instrumentation and Measurement Technology Conference, 1998. IMTC/98. Conference Proceedings. IEEE
Conference_Location :
St. Paul, MN
ISSN :
1091-5281
Print_ISBN :
0-7803-4797-8
Type :
conf
DOI :
10.1109/IMTC.1998.676969
Filename :
676969
Link To Document :
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