DocumentCode :
1592097
Title :
Scope of conference
fYear :
2010
Firstpage :
1
Lastpage :
1
Abstract :
Topics covered in this conference include: Application of microelectronics in product development; Device modeling, simulation and design; Device packaging & testing; Device physics and characterization; Material and new fabrication facilities technologies; Micromachining, microsensors and MEMS; Microwave device and MMIC; Opto-electronics and photonics technology; Process technology (CMOS,bipolar,BiCMOS,GaAs, etc); Reliability and failure analysis; Training and human resource development in microelectronics industry; Wafer Fabrication facilities and technology; Nano Technology; and Nano Electronics.
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Semiconductor Electronics (ICSE), 2010 IEEE International Conference on
Conference_Location :
Melaka
Print_ISBN :
978-1-4244-6608-5
Type :
conf
DOI :
10.1109/SMELEC.2010.5549512
Filename :
5549512
Link To Document :
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