Title :
A General Framework Supporting Co-simulation for BOM and DEVS
Author :
Chen, Bin ; Qiu, Xiao-Gang ; Huang, Ke-di
Author_Institution :
Sch. of Mechatron. & Autom., Nat. Univ. of Defense Technol., Changsha, China
Abstract :
Domain Specific Modeling brings the problem of simulator differences in simulation. Model Transformation and Co-Simulation are used to solve the problem. Compared to Model Transformation, Co-Simulation integrates the different simulations without the loss of model features. In this paper, we present a general framework supporting Co-Simulation for Base Object Model (BOM) and Discrete EVent System specification (DEVS). The framework is constituted of BOM-based simulation within the DEVS Proxy and DEVS-based simulation within the BOM Proxy. The embedded proxies are used to do the time synchronization and data transfer. The Time Automata is used to represent the models so that the models can be checked and verified by UPPAAL. The TimeStamped Atomic Model and General Simulation Data Collect (GSDC) algorithm are devised to implement the Co-Simulation framework. The adaptability and validity of the framework are testified by the Aircraft and Control Tower example. The experimental results show that the framework works well in supporting Co-Simulation.
Keywords :
automata theory; discrete event systems; electronic data interchange; formal specification; simulation; BOM Proxy; DEVS Proxy; UPPAAL; base object model; data transfer; discrete event system specification; domain specific modeling; general simulation data collect algorithm; model cosimulation; model transformation; simulator differences; time automata; time stamped atomic model; time synchronization; Assembly; Automata; Automation; Bills of materials; Computational modeling; Computer simulation; Discrete event systems; Mechatronics; Switches; Testing; BOM Proxy; Co-Simulation; DEVS Proxy; Timed Automata;
Conference_Titel :
Computer Modeling and Simulation, 2010. ICCMS '10. Second International Conference on
Conference_Location :
Sanya, Hainan
Print_ISBN :
978-1-4244-5642-0
Electronic_ISBN :
978-1-4244-5643-7
DOI :
10.1109/ICCMS.2010.225