Title :
A specification driven hierarchical test methodology
Author :
Sathianathan, Ramesh ; Smith, David R.
Author_Institution :
Dept. of Comput. Sci., State Univ. of New York, Stony Brook, NY, USA
Abstract :
A specification-driven hierarchical test methodology supporting both top-down and bottom-up design philosophies is presented. The methodology is built upon the SBL design system and uses modules described in the authors´ in-house HDL, SBL (Structural and Behavioral Language). A requirements specification for a circuit comprises a functional specification, describing the behavior of the circuit; a time specification, specifying the required timing of the module´s interface; and a test specification describing, in an algorithmic manner, a set of tests to be performed on the circuit. As the designer proceeds through the design cycle, in a top-down fashion, additional information about the circuit is used to incrementally modify the test specification to increase its fault coverage. The tests specified by the designer are then used to validate the other views of the circuit at each stage of the design cycle, using an integrated simulation and testing environment. In a bottom-up methodology, a test for a complete circuit is built from the combination of the specified tests of its submodules and generation of tests for their interconnections
Keywords :
application specific integrated circuits; automatic test software; circuit CAD; conformance testing; design for testability; fault diagnosis; hardware description languages; integrated circuit testing; logic CAD; logic testing; ASIC conformal testing; HDL; SBL design system; bottom-up methodology; functional specification; hierarchical test methodology; specification-driven; structural and behavioral language; test algorithm; test specification; time specification; top-down methodology; Automatic testing; Circuit faults; Circuit testing; Design methodology; Electronic equipment testing; Hardware; Integrated circuit testing; Logic testing; Timing; Very large scale integration;
Conference_Titel :
ASIC Conference and Exhibit, 1993. Proceedings., Sixth Annual IEEE International
Conference_Location :
Rochester, NY
Print_ISBN :
0-7803-1375-5
DOI :
10.1109/ASIC.1993.410805