• DocumentCode
    1592758
  • Title

    An extension of input sample acceptance for SELA MC600 micro-cleaving tool

  • Author

    Ahmataku, H.B. ; Kipli, Kuryati

  • Author_Institution
    X-FAB Sarawak Sdn. Bhd., Kuching, Malaysia
  • fYear
    2010
  • Firstpage
    183
  • Lastpage
    186
  • Abstract
    Minimum input sample size and thickness for SELA MC600, a micro-cleaving tool, is 9 × 6 mm and 0.6 mm respectively. The machine will reject sample which is smaller or thinner than this acceptance value. But, in semiconductor Failure Analysis (FA) laboratories, it is inevitable to face such small and thin sample, for instance, a die from backgrinded wafer. Therefore, a technique named Dual-Edged Cleaving (DEC) is invented to circumvent this restriction.
  • Keywords
    micromechanical devices; semiconductor device models; DEC; SELA MC600 microcleaving tool; backgrinded wafer; dual-edged cleaving; input sample acceptance; semiconductor failure analysis laboratory; Costs; Crystalline materials; Failure analysis; Ion beams; Laboratories; Milling; Optical microscopy; Particle beam optics; Silicon; Surface cleaning;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Semiconductor Electronics (ICSE), 2010 IEEE International Conference on
  • Conference_Location
    Melaka
  • Print_ISBN
    978-1-4244-6608-5
  • Type

    conf

  • DOI
    10.1109/SMELEC.2010.5549535
  • Filename
    5549535