DocumentCode
1592758
Title
An extension of input sample acceptance for SELA MC600 micro-cleaving tool
Author
Ahmataku, H.B. ; Kipli, Kuryati
Author_Institution
X-FAB Sarawak Sdn. Bhd., Kuching, Malaysia
fYear
2010
Firstpage
183
Lastpage
186
Abstract
Minimum input sample size and thickness for SELA MC600, a micro-cleaving tool, is 9 × 6 mm and 0.6 mm respectively. The machine will reject sample which is smaller or thinner than this acceptance value. But, in semiconductor Failure Analysis (FA) laboratories, it is inevitable to face such small and thin sample, for instance, a die from backgrinded wafer. Therefore, a technique named Dual-Edged Cleaving (DEC) is invented to circumvent this restriction.
Keywords
micromechanical devices; semiconductor device models; DEC; SELA MC600 microcleaving tool; backgrinded wafer; dual-edged cleaving; input sample acceptance; semiconductor failure analysis laboratory; Costs; Crystalline materials; Failure analysis; Ion beams; Laboratories; Milling; Optical microscopy; Particle beam optics; Silicon; Surface cleaning;
fLanguage
English
Publisher
ieee
Conference_Titel
Semiconductor Electronics (ICSE), 2010 IEEE International Conference on
Conference_Location
Melaka
Print_ISBN
978-1-4244-6608-5
Type
conf
DOI
10.1109/SMELEC.2010.5549535
Filename
5549535
Link To Document