• DocumentCode
    1592805
  • Title

    Test Simulation An Effective Approach to Reduce Development Cost of Mobile Phone

  • Author

    Li, Pengzhong ; Zhang, Weimin

  • Author_Institution
    Sino-German Sch. of Grad. Students, Tongji Univ., Shanghai, China
  • Volume
    2
  • fYear
    2010
  • Firstpage
    489
  • Lastpage
    492
  • Abstract
    Above 70 percent of production cost is determined by development and test phase. Modern simulation method can be used to simulate test process and substitute prototype manufacturing and test phase when finishing design proposal. Test simulation can effectively find design flaws and provide engineer direct reference to modify original design or remodel. Based on practical example of mobile phone, preparation process of simulation model was related, and a new model discretization method - partition method was given. A simulating calculation for free drop test was done, detailed results analysis was given. By calculating and analyzing, design flaws could be found and corresponding modifying measurement adopted can be given. Simulation results well accord with that of practical test with physical product. Test simulation can reduce development cost greatly and shorten marketed time.
  • Keywords
    cost reduction; flaw detection; mobile handsets; product design; product development; telecommunication equipment testing; design flaw; development cost reduction; free drop test; mobile phone; model discretization; partition method; preparation process; production cost; simulation model; test simulation; Costs; Design engineering; Finishing; Manufacturing processes; Mobile handsets; Production; Proposals; Testing; Virtual manufacturing; Virtual prototyping; design modification; development cost; prototype; test simulation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Computer Modeling and Simulation, 2010. ICCMS '10. Second International Conference on
  • Conference_Location
    Sanya, Hainan
  • Print_ISBN
    978-1-4244-5642-0
  • Electronic_ISBN
    978-1-4244-5643-7
  • Type

    conf

  • DOI
    10.1109/ICCMS.2010.107
  • Filename
    5421139