• DocumentCode
    1593001
  • Title

    On-site diagnosis of XLPE transmission power cables with Damped AC technique

  • Author

    Cichecki, P. ; Gulski, E. ; Smit, J.J. ; Chmura, L. ; Jongen, R.

  • Author_Institution
    Delft Univ. of Technol., Delft, Netherlands
  • fYear
    2010
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Diagnostics of HV power cables are playing an important role in the meaning of two aspects: 1) on-site diagnostic of new installation, where a commissioning test has to prove the absence of any defects in the cable insulation and accessories, after transportation and installation. 2) On-site diagnostic of a serviced aged power cable where the condition after a period in service or information about workmanship of repairs has to be known. As it is known some installation defects can result in breakdown even after a successful after-laying test. Obtaining more diagnostic parameters like; Withstand Voltage, Partial Discharges (PD) and Dielectric Loss (tan δ), providing a indication of insulation condition and accessory performance. In this paper several examples of on-site tests on new and serviced aged XLPE HV power cables will be discussed. Examples of: after-repair, after-laying, and condition assessment tests will be presented as performed with Damped AC diagnostics.
  • Keywords
    XLPE insulation; dielectric losses; partial discharges; power cable insulation; power cable testing; HV power cables; XLPE transmission power cables; after-laying test; after-repair test; cable insulation defects; condition assessment test; damped AC technique; dielectric loss; on-site diagnosis; partial discharges; serviced aged power cable; withstand voltage; Aging; Cable insulation; Dielectric losses; Dielectrics and electrical insulation; Electric breakdown; Insulation testing; Partial discharges; Power cables; Transportation; Voltage; HV power cables; condition evaluation; on-site diagnostics;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Insulation (ISEI), Conference Record of the 2010 IEEE International Symposium on
  • Conference_Location
    San Diego, CA
  • ISSN
    1089-084X
  • Print_ISBN
    978-1-4244-6298-8
  • Type

    conf

  • DOI
    10.1109/ELINSL.2010.5549546
  • Filename
    5549546