• DocumentCode
    1593068
  • Title

    Reliability design of campus ELT network

  • Author

    Yifei, Zhang ; Jiamu, Niu

  • Author_Institution
    Beihua University, Jilin City, China
  • fYear
    2012
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Reliability is a key technical indicator evaluating the overall performance of campus ELT network. With the acceleration of the process of digital campus construction, building a high reliable ELT network without single point of failure has become the core of digital campus. Based on the theory of computer network reliability, this article describes the optimal reliability design of campus ELT network from the technological angle of perfection, fault tolerance and network architecture.
  • Keywords
    ELT network; fault tolerance; network architecture; perfection; reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    World Automation Congress (WAC), 2012
  • Conference_Location
    Puerto Vallarta, Mexico
  • ISSN
    2154-4824
  • Print_ISBN
    978-1-4673-4497-5
  • Type

    conf

  • Filename
    6321784