DocumentCode
1593068
Title
Reliability design of campus ELT network
Author
Yifei, Zhang ; Jiamu, Niu
Author_Institution
Beihua University, Jilin City, China
fYear
2012
Firstpage
1
Lastpage
4
Abstract
Reliability is a key technical indicator evaluating the overall performance of campus ELT network. With the acceleration of the process of digital campus construction, building a high reliable ELT network without single point of failure has become the core of digital campus. Based on the theory of computer network reliability, this article describes the optimal reliability design of campus ELT network from the technological angle of perfection, fault tolerance and network architecture.
Keywords
ELT network; fault tolerance; network architecture; perfection; reliability;
fLanguage
English
Publisher
ieee
Conference_Titel
World Automation Congress (WAC), 2012
Conference_Location
Puerto Vallarta, Mexico
ISSN
2154-4824
Print_ISBN
978-1-4673-4497-5
Type
conf
Filename
6321784
Link To Document