• DocumentCode
    1593133
  • Title

    Novel Silicon Surface Pre-Treatment (SSPT) Technique for CMOS Device Performance Boosting

  • Author

    Lee, Da-Yuan ; Chen, C.C. ; Huang, C.H. ; Lim, P.S. ; Chan, M.H. ; Yeh, M.S. ; Huang, C.S. ; Tao, H.J. ; Mii, YJ

  • Author_Institution
    Taiwan Semicond. Manuf. Co., Hsinchu
  • fYear
    2008
  • Firstpage
    42
  • Lastpage
    43
  • Abstract
    In this paper, a novel surface treatment technique using Silicon Surface Pre-Treatment (SSPT) technique to boost high performance CMOS circuit is reported. This approach provides a smooth silicon surface and extends the effective channel width to enhance device performance on both N and PMOSFET In this work, a smooth and rounded active area (AA) surface was successfully fabricated. Using this technique, we demonstrated a significant device boost of 15% and 7% on small dimension N and PMOSFET, respectively. These achievements were demonstrated without negative impact on GOI and NBTI.
  • Keywords
    MOS integrated circuits; MOSFET; elemental semiconductors; silicon; surface treatment; CMOS circuit; NMOSFET; PMOSFET; Si; effective channel width; rounded active area surface; silicon surface pre-treatment; smooth active area surface; Boosting; CMOS technology; Interface states; MOSFET circuits; Niobium compounds; Rough surfaces; Silicon; Surface roughness; Surface topography; Surface treatment;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology, Systems and Applications, 2008. VLSI-TSA 2008. International Symposium on
  • Conference_Location
    Hsinchu
  • ISSN
    1524-766X
  • Print_ISBN
    978-1-4244-1614-1
  • Electronic_ISBN
    1524-766X
  • Type

    conf

  • DOI
    10.1109/VTSA.2008.4530790
  • Filename
    4530790