Title :
An integrated approach for criticality prediction
Author :
Ebert, Christof ; Liedtke, Thomas
Author_Institution :
Alcatel SEL, Stuttgart, Germany
Abstract :
The paper provides insight in techniques for criticality prediction as they are applied within the development of Alcatel 1000 S12 switching software. The primary goal is to identify critical components and to make failure predictions as early as possible during the life cycle and hence reduce managerial risk combined with too early or too late release. The approach is integrated in the development process and starts with complexity based criticality prediction of modules. Modules identified as overly complex are given additional tests or review efforts. Release time prediction and field performance prediction are both based on tailored ENHPP reliability models. For the complete approach of criticality prediction, recent data from the development of a switching system with around 2 MLOC is provided. The switching system is currently in operational use, thus allowing for validation and tuning of the prediction models
Keywords :
safety-critical software; software fault tolerance; software metrics; telecommunication computing; telecommunication switching; 2 MLOC; Alcatel 1000 S12 switching software; complexity based criticality prediction; criticality prediction; failure predictions; field performance prediction; integrated approach; managerial risk; switching system; tailored ENHPP reliability models; ISDN; Predictive models; Quality management; Real time systems; Risk management; Scheduling; Software quality; Switches; Switching systems; Testing;
Conference_Titel :
Software Reliability Engineering, 1995. Proceedings., Sixth International Symposium on
Conference_Location :
Toulouse
Print_ISBN :
0-8186-7131-9
DOI :
10.1109/ISSRE.1995.497639