• DocumentCode
    159331
  • Title

    Fabrication tolerant silicon MZI filter

  • Author

    Dwivedi, Shipra ; D´heer, Herbert ; Bogaerts, W.

  • Author_Institution
    IMEC, Dept. of Inf. Technol., Ghent Univ., Ghent, Belgium
  • fYear
    2014
  • fDate
    27-29 Aug. 2014
  • Firstpage
    147
  • Lastpage
    148
  • Abstract
    A compact fabrication tolerant MZI filter is demonstrated. The measured device shows a 20-fold improved tolerance to systematic waveguide linewidth variations, with a wavelength shift of less than 60 pm/nm linewidth change.
  • Keywords
    Mach-Zehnder interferometers; optical fabrication; optical waveguide filters; silicon; compact fabrication tolerant silicon MZI filter; improved tolerance; linewidth change; systematic waveguide linewidth variation; wavelength shift; Active filters; Fabrication; Optical waveguides; Sensitivity; Silicon; Waveguide transitions; Wavelength measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Group IV Photonics (GFP), 2014 IEEE 11th International Conference on
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4799-2282-6
  • Type

    conf

  • DOI
    10.1109/Group4.2014.6961969
  • Filename
    6961969