Automated test data development for semi-custom ICs: An ideal approach to fast development

Author

Deo, Nitin

Author_Institution

Application Specific Product Group Philips Semicond., Sunnyvale, CA, USA

fYear

1993

Firstpage

62

Lastpage

64

Abstract

With the advent of high performance technologies (sub-micron CMOS, BiCMOS, and BiNMOS), the practicality of automated test data development will be emphasized. Although automatic test pattern generation and timing analysis are currently considered desirable, the complexity and size of future ICs will make them mandatory. The author describes a new trend in test data development for a complex semi-custom IC and the benefits of that methodology through the development of an ASSP (application specific standard product)

Keywords

application specific integrated circuits; automatic test software; circuit CAD; circuit analysis computing; design for testability; integrated circuit testing; logic CAD; logic testing; timing; ASIC; application specific standard product; automated test data development; automatic test pattern generation; fast development; functional test; semi-custom IC; timing analysis; timing verification; Application specific integrated circuits; Automatic testing; CMOS technology; Delay estimation; Integrated circuit testing; Logic design; Logic testing; Standards development; System-level design; Timing;

fLanguage

English

Publisher

ieee

Conference_Titel

ASIC Conference and Exhibit, 1993. Proceedings., Sixth Annual IEEE International

Conference_Location

Rochester, NY

Print_ISBN

0-7803-1375-5

Type

conf

DOI

10.1109/ASIC.1993.410807

Filename

410807