• DocumentCode
    1593609
  • Title

    Optimal PD-SOI Technology for High Performance Applications

  • Author

    Chiang, W.T. ; Liu, P.W. ; Huang, Y.T. ; Tsai, T.L. ; Lin, Y.H. ; Tsai, C.H. ; Laplanche, Y. ; Pelloie, J.L. ; Tsai, C.T. ; Ma, G.H.

  • Author_Institution
    United Microelectron. Corp. (UMC), Tainan
  • fYear
    2008
  • Firstpage
    93
  • Lastpage
    94
  • Abstract
    We present an optimal partially-depleted silicon-on-insulator (PD-SOI) platform, which demonstrates superior performance of SOI over bulk technology. Device optimization is performed in terms of circuit switch speed and power consumption through channel and S/D engineering. Fundamental device characteristics, SRAM yields, reliability assessment, and physical IP qualification for our PD-SOI platform are all validated to demonstrate the feasibility for high performance applications. Performance comparison based on circuit simulation clearly shows the SOI advantage on area and power consumption. In addition, the strained-SOI (sSOI) technology is developed for further SOI performance enhancement.
  • Keywords
    SRAM chips; circuit optimisation; silicon-on-insulator; SRAM; bulk technology; circuit switch speed; device optimization; high performance applications; optimal PD-SOI technology; optimal partially-depleted silicon-on-insulator platform; physical IP qualification; power consumption; reliability assessment; strained-SOI technology; CMOS technology; Capacitance; Energy consumption; MOS devices; Manufacturing; Power engineering and energy; Random access memory; Silicon on insulator technology; Switches; Switching circuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology, Systems and Applications, 2008. VLSI-TSA 2008. International Symposium on
  • Conference_Location
    Hsinchu
  • ISSN
    1524-766X
  • Print_ISBN
    978-1-4244-1614-1
  • Electronic_ISBN
    1524-766X
  • Type

    conf

  • DOI
    10.1109/VTSA.2008.4530814
  • Filename
    4530814