Title :
Optimal PD-SOI Technology for High Performance Applications
Author :
Chiang, W.T. ; Liu, P.W. ; Huang, Y.T. ; Tsai, T.L. ; Lin, Y.H. ; Tsai, C.H. ; Laplanche, Y. ; Pelloie, J.L. ; Tsai, C.T. ; Ma, G.H.
Author_Institution :
United Microelectron. Corp. (UMC), Tainan
Abstract :
We present an optimal partially-depleted silicon-on-insulator (PD-SOI) platform, which demonstrates superior performance of SOI over bulk technology. Device optimization is performed in terms of circuit switch speed and power consumption through channel and S/D engineering. Fundamental device characteristics, SRAM yields, reliability assessment, and physical IP qualification for our PD-SOI platform are all validated to demonstrate the feasibility for high performance applications. Performance comparison based on circuit simulation clearly shows the SOI advantage on area and power consumption. In addition, the strained-SOI (sSOI) technology is developed for further SOI performance enhancement.
Keywords :
SRAM chips; circuit optimisation; silicon-on-insulator; SRAM; bulk technology; circuit switch speed; device optimization; high performance applications; optimal PD-SOI technology; optimal partially-depleted silicon-on-insulator platform; physical IP qualification; power consumption; reliability assessment; strained-SOI technology; CMOS technology; Capacitance; Energy consumption; MOS devices; Manufacturing; Power engineering and energy; Random access memory; Silicon on insulator technology; Switches; Switching circuits;
Conference_Titel :
VLSI Technology, Systems and Applications, 2008. VLSI-TSA 2008. International Symposium on
Conference_Location :
Hsinchu
Print_ISBN :
978-1-4244-1614-1
Electronic_ISBN :
1524-766X
DOI :
10.1109/VTSA.2008.4530814