DocumentCode
1593609
Title
Optimal PD-SOI Technology for High Performance Applications
Author
Chiang, W.T. ; Liu, P.W. ; Huang, Y.T. ; Tsai, T.L. ; Lin, Y.H. ; Tsai, C.H. ; Laplanche, Y. ; Pelloie, J.L. ; Tsai, C.T. ; Ma, G.H.
Author_Institution
United Microelectron. Corp. (UMC), Tainan
fYear
2008
Firstpage
93
Lastpage
94
Abstract
We present an optimal partially-depleted silicon-on-insulator (PD-SOI) platform, which demonstrates superior performance of SOI over bulk technology. Device optimization is performed in terms of circuit switch speed and power consumption through channel and S/D engineering. Fundamental device characteristics, SRAM yields, reliability assessment, and physical IP qualification for our PD-SOI platform are all validated to demonstrate the feasibility for high performance applications. Performance comparison based on circuit simulation clearly shows the SOI advantage on area and power consumption. In addition, the strained-SOI (sSOI) technology is developed for further SOI performance enhancement.
Keywords
SRAM chips; circuit optimisation; silicon-on-insulator; SRAM; bulk technology; circuit switch speed; device optimization; high performance applications; optimal PD-SOI technology; optimal partially-depleted silicon-on-insulator platform; physical IP qualification; power consumption; reliability assessment; strained-SOI technology; CMOS technology; Capacitance; Energy consumption; MOS devices; Manufacturing; Power engineering and energy; Random access memory; Silicon on insulator technology; Switches; Switching circuits;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Technology, Systems and Applications, 2008. VLSI-TSA 2008. International Symposium on
Conference_Location
Hsinchu
ISSN
1524-766X
Print_ISBN
978-1-4244-1614-1
Electronic_ISBN
1524-766X
Type
conf
DOI
10.1109/VTSA.2008.4530814
Filename
4530814
Link To Document