DocumentCode :
159365
Title :
Study of induced strain in silicon rib structures
Author :
Marini, D. ; Montanari, G.B. ; Mancarella, F. ; Ferri, M. ; Balboni, R. ; Bolognini, G.
Author_Institution :
Consiglio Naz. delle Ric., IMM Inst., Bologna, Italy
fYear :
2014
fDate :
27-29 Aug. 2014
Firstpage :
195
Lastpage :
196
Abstract :
This paper reports a theoretical and experimental study on induced strain in silicon-based rib structures. Simulations of induced stress and strain distribution were performed for nitride-strained silicon; moreover, locally-accurate strain measurements were performed on manufactured rib structures in proximity of the nitride-to-silicon interface employing the Convergent Beam Electron Diffraction (CBED) technique. The study resulted in good accordance between simulated and measured strain behaviors along the rib cross-section, indicating the possibility to achieve significant strain levels (e.g. higher than 2 mε for the εzz strain tensor component).
Keywords :
optical planar waveguides; rib waveguides; silicon; stress-strain relations; CBED; Si; convergent beam electron diffraction technique; induced strain; nitride-strained silicon; rib cross-section; silicon rib structures; strain distribution; stress distribution; Diffraction; Lattices; Optical variables measurement; Silicon; Strain; Strain measurement; Stress; All-optical networks; Integrated optics; Optical switching devices; strained silicon;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Group IV Photonics (GFP), 2014 IEEE 11th International Conference on
Conference_Location :
Paris
Print_ISBN :
978-1-4799-2282-6
Type :
conf
DOI :
10.1109/Group4.2014.6961987
Filename :
6961987
Link To Document :
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