• DocumentCode
    159428
  • Title

    Experimental demonstration of TM lateral leakage in a standard SOI photonics platform

  • Author

    Hope, Anthony P. ; Nguyen, Thach G. ; Bogaerts, W. ; Mitchell, A.

  • Author_Institution
    ARC Centre of Excellence for Ultrahigh bandwidth Devices for Opt. Syst. (CUDOS) & Sch. of Electr. & Comput. Eng., RMIT Univ., Melbourne, VIC, Australia
  • fYear
    2014
  • fDate
    27-29 Aug. 2014
  • Firstpage
    77
  • Lastpage
    78
  • Abstract
    We provide an experimental demonstration of the width dependent losses of the fundamental TM guided mode in fabricated silicon-on-insulator shallow etched ridge waveguides.
  • Keywords
    etching; integrated optics; optical fabrication; optical losses; optical waveguides; ridge waveguides; silicon-on-insulator; Si; TM lateral leakage; fundamental TM guided mode; shallow etched ridge waveguides; silicon-on-insulator; standard SOI photonics platform; width dependent losses; Couplers; Gratings; Optical losses; Optical waveguides; Photonics; Slabs; Standards;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Group IV Photonics (GFP), 2014 IEEE 11th International Conference on
  • Conference_Location
    Paris
  • Print_ISBN
    978-1-4799-2282-6
  • Type

    conf

  • DOI
    10.1109/Group4.2014.6962028
  • Filename
    6962028
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=159428