An optical method for the time-to-digital converters characterization

Measurement of the distribution random error describing a high precision multi-tapped delay lines with coding registers module is important from the perspective of construction high-resolution time-to-digital converters. Knowledge of this distribution allows to optimize the process of implementation Multi-Tapped Delay Lines in programmable structures, thus obtaining the converters with much improved processing performance. In this article a new method for optical measuring of the delay line characteristics is presented. Using this method, the distributions of probabilities of counts in each time-channels are also executed. Finally, the experimental results obtained from optical and widely used a statistical code-density test method were also compared.