• DocumentCode
    1594557
  • Title

    A new algorithm for CAD-directed CMM dimensional inspection

  • Author

    Lin, Yueh-Jaw ; Murugappan, Prabakar

  • Author_Institution
    Dept. of Mech. Eng., Akron Univ., OH, USA
  • Volume
    1
  • fYear
    1998
  • Firstpage
    893
  • Abstract
    In this investigation, a framework for integrating the CMM into the CAD/CAM environment is developed to automate the process of design, manufacturing and inspection. An algorithm to generate an optimum collision free CMM probe path is proposed. This algorithm uses the ray tracing technique to locate the collision of the possible paths, between the initial probe point and the target point, with the workpiece to be inspected. If there is a collision, the algorithm walks through the topological structure of the part and selects the midpoint of the edge, shared by the face with which the path collides and the adjacent face nearest to the target point, as the next probe point. This procedure is followed till the target point is reached. The first half of the proposed algorithm is implemented using Mechanical Desktop and its Runtime Extension (ARX) as the API, running on an Windows NT 4.0 platform. The effectiveness of the proposed algorithm is verified by the results of the implementation demonstrating optimum collision-free dimensional inspection path generation for three prismatic parts
  • Keywords
    CAD/CAM; computerised instrumentation; graphical user interfaces; inspection; measurement systems; optimisation; path planning; spatial variables measurement; API; ARX; CAD-directed CMM dimensional inspection; CAD/CAM; Mechanical Desktop; Runtime Extension; Windows NT 4.0; collision location; edge midpoint; optimum collision free CMM probe path; optimum collision-free dimensional inspection path generation; prismatic parts; ray tracing; target point; topological structure; CADCAM; Computer aided manufacturing; Coordinate measuring machines; Design automation; Inspection; Manufacturing automation; Manufacturing processes; Probes; Process design; Ray tracing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Robotics and Automation, 1998. Proceedings. 1998 IEEE International Conference on
  • Conference_Location
    Leuven
  • ISSN
    1050-4729
  • Print_ISBN
    0-7803-4300-X
  • Type

    conf

  • DOI
    10.1109/ROBOT.1998.677100
  • Filename
    677100