• DocumentCode
    1594600
  • Title

    Unreliable sensor grids: coverage, connectivity and diameter

  • Author

    Shakkottai, Sanjay ; Srikant, R. ; Shroff, Ness

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Texas Univ., Austin, TX, USA
  • Volume
    2
  • fYear
    2003
  • Firstpage
    1073
  • Abstract
    We consider an unreliable wireless sensor grid-network with n nodes placed in a square of unit area. We are interested in the coverage of the region and the connectivity of the network. We first show that the necessary and sufficient conditions for the random grid network to cover the unit square region as well as ensure that the active nodes are connected are of the form p(n)r2(n) ~ log(n)/n, where r(n) is the transmission radius of each node and p(n) is the probability that a node is "active" (not failed). This result indicates that, when n is large, even if each node is highly unreliable and the transmission power is small, we can still maintain connectivity with coverage. We also show that the diameter of the random grid (i.e., the maximum number of hops required to travel from any active node to another) is of the order √{n/log(n)}. Finally, we derive a sufficient condition for connectivity of the active nodes (without necessarily having coverage). If the node success probability p(n) is small enough, we show that connectivity does not imply coverage.
  • Keywords
    stochastic processes; telecommunication network reliability; wireless sensor networks; active nodes connectivity; node success probability; queueing theory; random grid diameter; random grid network coverage; stochastic processes; transmission power; wireless sensor grid-network; Intelligent sensors; Large-scale systems; Monitoring; Queueing analysis; Routing; Sensor systems; Stochastic processes; Sufficient conditions; Surges; Wireless sensor networks;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    INFOCOM 2003. Twenty-Second Annual Joint Conference of the IEEE Computer and Communications. IEEE Societies
  • Conference_Location
    San Francisco, CA
  • ISSN
    0743-166X
  • Print_ISBN
    0-7803-7752-4
  • Type

    conf

  • DOI
    10.1109/INFCOM.2003.1208944
  • Filename
    1208944