DocumentCode
159465
Title
Artificial intelligence based task mapping and pipelined scheduling for checkpointing on real time systems with imperfect fault detection
Author
Das, Aruneema ; Kumar, Ajit ; Veeravalli, Bharadwaj
Author_Institution
Dept. of Electr. & Comput. Eng., Nat. Univ. of Singapore, Singapore, Singapore
fYear
2014
fDate
1-3 Oct. 2014
Firstpage
134
Lastpage
140
Abstract
Fault-tolerance is emerging as one of the important optimization objectives for designs in deep submicron technology nodes. This paper proposes a technique of application mapping and scheduling with checkpointing on a multiprocessor system to maximize the reliability considering transient faults. The proposed model incorporates checkpoints with imperfect fault detection probability, and pipelined execution and cyclic dependency associated with multimedia applications. This is solved using an Artificial Intelligence technique known as Particle Swarm Optimization to determine the number of checkpoints of every task of the application that maximizes the confidence of the output. The proposed approach is validated experimentally with synthetic and real-life application graphs. Results demonstrate the proposed technique improves the probability of correct result by an average 15% with imperfect fault detection. Additionally, even with 100% fault detection, the proposed technique is able to achieve better results (25% higher confidence) as compared to the existing fault-tolerant techniques.
Keywords
artificial intelligence; checkpointing; fault diagnosis; graph theory; multiprocessing systems; particle swarm optimisation; processor scheduling; reliability; software fault tolerance; application mapping technique; artificial intelligence based task mapping; checkpointing; deep submicron technology nodes; fault-tolerant techniques; imperfect fault detection probability; multiprocessor system; particle swarm optimization; pipelined scheduling; real-life application graphs; real-time systems; reliability; synthetic graphs; transient faults; Checkpointing; Fault detection; Fault tolerance; Fault tolerant systems; Throughput; Transient analysis;
fLanguage
English
Publisher
ieee
Conference_Titel
Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2014 IEEE International Symposium on
Conference_Location
Amsterdam
Print_ISBN
978-1-4799-6154-2
Type
conf
DOI
10.1109/DFT.2014.6962066
Filename
6962066
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