• DocumentCode
    159467
  • Title

    Automated formal approach for debugging dividers using dynamic specification

  • Author

    Haghbayan, Mohammad-Hashem ; Alizadeh, Behrooz ; Rahmani, Amir-Mohammad ; Liljeberg, Pasi ; Tenhunen, Hannu

  • Author_Institution
    Dept. of Inf. Technol., Univ. of Turku, Turku, Finland
  • fYear
    2014
  • fDate
    1-3 Oct. 2014
  • Firstpage
    264
  • Lastpage
    269
  • Abstract
    This paper presents a formal approach to verify and debug division circuits. The proposed technique is based on a reverse-engineering mechanism where a high-level model of the gate-level implementation is obtained and then an intermediate representation of the specification is introduced. This process makes equivalence checking between two models possible. The main advantage of this representation is the fact that the specification is dynamically changed according to the information obtained from the implementation. At the end, if two updated models are not equivalent, possible bugs can be localized and then corrected automatically by analyzing the difference. Experimental results show the robustness of the proposed approach in comparison with other contemporary methods in terms of the run time execution. The results also reveal that up to two orders of magnitude of average speedup can be obtained compared with the state-of-the-art.
  • Keywords
    circuit testing; dividing circuits; electronic engineering computing; logic testing; reverse engineering; automated formal approach; debugging; dividers; division circuits; equivalence checking; gate-level implementation; reverse-engineering mechanism; run time execution; Discrete Fourier transforms; Fault tolerance; Fault tolerant systems; Nanotechnology; Very large scale integration; Arithmetic and logic units; Debugging aids; Diagnostics; Formal models; Verification;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2014 IEEE International Symposium on
  • Conference_Location
    Amsterdam
  • Print_ISBN
    978-1-4799-6154-2
  • Type

    conf

  • DOI
    10.1109/DFT.2014.6962068
  • Filename
    6962068