• DocumentCode
    159470
  • Title

    Characterizing soft error vulnerability of cache coherence protocols for chip-multiprocessors

  • Author

    Chuanlei Zheng ; Shuai Wang

  • Author_Institution
    Dept. of Comput. Sci. & Technol., Nanjing Univ., Nanjing, China
  • fYear
    2014
  • fDate
    1-3 Oct. 2014
  • Firstpage
    15
  • Lastpage
    20
  • Abstract
    Soft-error induced reliability problems have become a major challenge in designing new generation microprocessors. Due to the on-chip caches´ dominant share in die area and transistor budget, protecting them against soft errors is of paramount importance. Recent research has focused on the characterization and optimization for the reliability of data caches in single-core processors. As the mainstream processors enter the multi-/many-core era, the area share of the on-chip caches keeps increasing, which makes them more vulnerable to soft errors. However, few research work has studied the vulnerability of the on-chip caches in the context of the cache coherence protocols. In this work, we propose to characterize the soft error vulnerability of the L1 data cache in chip-multiprocessors (CMPs) under the influence of different cache coherence protocols. This study aims to provide insights into cache vulnerability behaviors in CMPs as well as guidance in designing reliable cache coherence protocols. Furthermore, an early-invalidation scheme is proposed to reduce the overall vulnerability factor of the data caches in CMPs. Benchmarking is carried out to showcase the effectiveness of our approach.
  • Keywords
    cache storage; integrated circuit reliability; microprocessor chips; multiprocessing systems; radiation hardening (electronics); L1 data cache; cache coherence protocols; chip-multiprocessors; die area; mainstream processors; many-core era; multicore era; on-chip cache dominant share; paramount importance; single-core processors; soft error vulnerability; soft-error induced reliability problems; transistor budget; Coherence; Optimization; Program processors; Protocols; Reliability engineering; System-on-chip; Cache Coherence Protocol; Reliability; Soft Error;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2014 IEEE International Symposium on
  • Conference_Location
    Amsterdam
  • Print_ISBN
    978-1-4799-6154-2
  • Type

    conf

  • DOI
    10.1109/DFT.2014.6962071
  • Filename
    6962071