DocumentCode :
159476
Title :
A built-in calibration system with a reduced FFT engine for linearity optimization of low power LNA
Author :
Yongsuk Choi ; Chun-Hsiang Chang ; In-Seok Jung ; Onabajo, Marvin ; Yong-Bin Kim
Author_Institution :
Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA, USA
fYear :
2014
fDate :
1-3 Oct. 2014
Firstpage :
222
Lastpage :
227
Abstract :
A digital built-in calibration (BIC) system with a power and area optimized on-chip fast Fourier transform (FFT) engine is presented to automatically adjust the linearity of a tunable RF low-noise amplifier (LNA) operating at 2.4GHz. An envelope detection circuit is used to extract the linearity characteristics at low frequencies, enabling the sampling and digital signal processing at low rates. To compensate the low gain of an envelope detector and to enhance reliability of spectral analysis, an RF amplifier is designed between the LNA and the envelope detector. The output of the envelope detector is digitized before the spectrum calculation with the integrated FFT for estimation of the third-order intermodulation (IM3) distortion specification of the LNA. The digitally-assisted closed-loop calibration scheme is demonstrated with simulations using a two-tone test with 1MHz tone spacing, a 512-point FFT engine, a 10-bit analog-to-digital converter model, and digital blocks operating with a 51.2MHz clock frequency. The total time required for calibration is 485μs including delays of 1.2μs to allow settling of the LNA output after capacitor array changes for tuning. In order to validate the proposed BIC technique with device mismatch effects, Monte Carlo simulations are performed with the same condition at transient simulations, where the results are well matched with the optimum IM3 component values calculated at the output node of LNA. The digital blocks were implemented using a standard 0.13μm CMOS technology.
Keywords :
CMOS integrated circuits; Monte Carlo methods; UHF amplifiers; analogue-digital conversion; calibration; capacitors; fast Fourier transforms; intermodulation distortion; low noise amplifiers; low-power electronics; BIC system; CMOS technology; Monte Carlo simulations; RF amplifier; analog-to-digital converter; built-in calibration system; capacitor array; clock frequency; digital signal processing; digitally-assisted closed-loop calibration; enhance reliability; envelope detection circuit; frequency 1 MHz; frequency 2.4 GHz; frequency 51.2 MHz; linearity characteristics; linearity optimization; low power LNA; on-chip fast Fourier transform engine; reduced FFT engine; size 0.13 mum; spectral analysis; third-order intermodulation distortion; tone spacing; transient simulations; tunable RF low-noise amplifier; word length 10 bit; Calibration; Engines; Envelope detectors; Hardware; Linearity; Radio frequency; Tuning; Low-noise amplifier (LNA); analog/RF testing; built-in calibration (BIC); envelope detection; fast Fourier transform (FFT); linearization; spectral analysis; third-order intermodulation;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2014 IEEE International Symposium on
Conference_Location :
Amsterdam
Print_ISBN :
978-1-4799-6154-2
Type :
conf
DOI :
10.1109/DFT.2014.6962077
Filename :
6962077
Link To Document :
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