• DocumentCode
    159477
  • Title

    A 12-bit 32MS/s SAR ADC using built-in self calibration technique to minimize capacitor mismatch

  • Author

    In-Seok Jung ; Yong-Bin Kim

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Northeastern Univ., Boston, MA, USA
  • fYear
    2014
  • fDate
    1-3 Oct. 2014
  • Firstpage
    276
  • Lastpage
    280
  • Abstract
    This paper presents a low-power 12-bit 32MS/s successive approximation register (SAR) analog-to-digital converter (ADC) using a single input with a novel Built-in Self Calibration (BiSC) feature to reduce the capacitor mismatch of the digital-to-analog converter (DAC) and to compensate the comparator input offset voltage. The proposed self-calibration scheme optimize the mismatch of the DAC by changing additional auxiliary capacitor array during calibration mode. In addition, in order to minimize the offset voltage of the comparator in the SAR ADC, a simplified voltage amplifier is proposed. The controller for the proposed algorithm operates as fore-ground operation so that low power consumption is achieved. Consequently, the mismatch error of the DAC can be minimized and the SAR based ADC operates without any extra power dissipation for the circuitry of self calibration during normal operation. The prototype was designed using 0.13μm single poly 6 metal standard CMOS technology. The ADC achieves a SNDR of 65.2 dB and consumes 3.57 mW with 1.2V supply voltage and sampling rate of 32 MS/s. Compared to the converters that use the conventional procedure, INL and DNL are reduced by about 45% and 51%, respectively.
  • Keywords
    CMOS integrated circuits; amplifiers; analogue-digital conversion; calibration; capacitors; comparators (circuits); digital-analogue conversion; low-power electronics; ADC; BiSC; DAC; SAR; analog-to-digital converter; auxiliary capacitor array; built-in self calibration; capacitor mismatch; comparator; digital-to-analog converter; fore-ground operation; low power consumption; power 3.57 mW; simplified voltage amplifier; single poly 6 metal standard CMOS technology; size 0.13 mum; successive approximation register; voltage 1.2 V; word length 12 bit; Arrays; Calibration; Capacitance; Capacitors; Power demand; Registers; Very large scale integration;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2014 IEEE International Symposium on
  • Conference_Location
    Amsterdam
  • Print_ISBN
    978-1-4799-6154-2
  • Type

    conf

  • DOI
    10.1109/DFT.2014.6962078
  • Filename
    6962078