DocumentCode :
159482
Title :
Exploiting Intel TSX for fault-tolerant execution in safety-critical systems
Author :
Haas, Florian ; Weis, Sebastian ; Metzlaff, Stefan ; Ungerer, Theo
Author_Institution :
Dept. of Comput. Sci., Univ. of Augsburg, Augsburg, Germany
fYear :
2014
fDate :
1-3 Oct. 2014
Firstpage :
197
Lastpage :
202
Abstract :
Safety-critical systems demand increasing computational power, which requests high-performance embedded systems. While commercial-of-the-shelf (COTS) processors offer high computational performance for a low price, they do not provide hardware support for fault-tolerant execution. However, pure software-based fault-tolerance methods entail high design complexity and runtime overhead. In this paper, we present an efficient software/hardware-based redundant execution scheme for a COTS ×86 processor, which exploits the Transactional Synchronization Extensions (TSX) introduced with the Intel Haswell microarchitecture. Our approach extends a static binary instrumentation tool to insert fault-tolerant transactions and fault-detection instructions at function granularity. TSX hardware support is used for error containment and recovery. The average runtime overhead for selected SPEC2006 benchmarks was only 49% compared to a non-fault-tolerant execution.
Keywords :
electronic engineering computing; fault tolerant computing; microprocessor chips; safety-critical software; COTS processors; Intel Haswell microarchitecture; Intel TSX; SPEC2006 benchmarks; TSX hardware support; commercial-of-the-shelf processors; error containment; error recovery; fault-tolerant execution; hardware-based redundant execution scheme; safety-critical systems; software-based fault-tolerance methods; software-based redundant execution scheme; static binary instrumentation tool; transactional synchronization extensions; Benchmark testing; Fault tolerance; Fault tolerant systems; Hardware; Instruments; Program processors; Registers;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT), 2014 IEEE International Symposium on
Conference_Location :
Amsterdam
Print_ISBN :
978-1-4799-6154-2
Type :
conf
DOI :
10.1109/DFT.2014.6962083
Filename :
6962083
Link To Document :
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