Title :
Analysis on measuring performance of three Flicker Detecting Methods
Author :
Chen, Qing ; Jia, Xiufang ; Zhao, Chengyong
Author_Institution :
Key Lab. of Power Syst. Protection & Dynamic Security Monitoroing & Control under Minist. of Educ., North China Electr. Power Univ., Baoding, China
Abstract :
Voltage fluctuation and flicker is an important aspect of power quality. The core of flicker analysis is to track the envelope of voltage signals and then calculate the short-term flicker severity Pst, which is the premise of flicker source location. This paper firstly derives the formulas of extracting flicker envelope of signals containing harmonics using Teager energy operator and Hilbert transform. Then the measuring performance of Teager energy operator, Hilbert transform and square demodulation of flicker with one frequency, multi-frequencies and with harmonics are analyzed. After extracting the flicker envelope, the flicker frequency and amplitude error, and short-term flicker severity Pst error are calculated. Besides the relationships between amplitude error and frequency, Pst error and frequency with respect to these three methods are illustrated respectively. At last it is proved that Hilbert transform has the highest accuracy and stability than TEO and square demodulation with the increase of frequency.
Keywords :
Hilbert transforms; harmonic analysis; power supply quality; Hilbert transform; Teager energy operator; amplitude error; flicker analysis; flicker detecting methods; flicker frequency; flicker source location; flicker square demodulation; power quality; short-term flicker severity; voltage flicker; voltage fluctuation; voltage signals; Demodulation; Energy measurement; Frequency measurement; Harmonic analysis; Performance analysis; Position measurement; Power quality; Signal analysis; Stability; Voltage fluctuations; Hilbert transform; Teager energy operator; short-term flicker severity Pst; square demodulation; voltage fluctuation and flicker;
Conference_Titel :
Power & Energy Society General Meeting, 2009. PES '09. IEEE
Conference_Location :
Calgary, AB
Print_ISBN :
978-1-4244-4241-6
DOI :
10.1109/PES.2009.5275912