Title :
Common-mode noise reduction in DC-DC converters by common-source type active-clamp technique
Author :
Li, Ge ; Shoyama, Masahito ; Ninomiya, Tamotsu ; Inoue, Tokunari
Author_Institution :
Dept. of Electr. & Electron. Syst. Eng., Kyushu Univ., Fukuoka, Japan
fDate :
6/23/1905 12:00:00 AM
Abstract :
Several topologies of active-clamped DC-DC power converters have been proposed previously. This paper compares the common-mode-noise properties of the conventional type using a pulse transformer for a gate driver and the common-source type proposed recently. Using a noise measuring system composed of LISN (line impedance stabilization network) and EMSCAN (electromagnetic scanning system), it has been clarified that the common-source type has the superiority on noise reduction
Keywords :
DC-DC power convertors; active networks; circuit testing; field effect transistor switches; interference suppression; power MOSFET; power semiconductor switches; pulse transformers; switching circuits; EMSCAN; LISN; active-clamped DC-DC power converters; common-mode noise reduction; common-source type active-clamp technique; electromagnetic scanning system; gate driver; line impedance stabilization network; noise reduction; pulse transformer; Circuit noise; DC-DC power converters; Noise generators; Noise measurement; Noise reduction; Pulse transformers; Switches; Switching circuits; Switching converters; Zero voltage switching;
Conference_Titel :
Power Electronics Specialists Conference, 2001. PESC. 2001 IEEE 32nd Annual
Conference_Location :
Vancouver, BC
Print_ISBN :
0-7803-7067-8
DOI :
10.1109/PESC.2001.954379
