Title :
Silicon chip based wavelength conversion of ultra-high repetition rate data signals
Author :
Hu, H. ; Ji, H. ; Galili, M. ; Pu, M. ; Mulvad, H.C.H. ; Oxenløwe, L.K. ; Yvind, K. ; Hvam, J.M. ; Jeppesen, P.
Author_Institution :
DTU Fotonik, Tech. Univ. of Denmark, Lyngby, Denmark
Abstract :
We report on all-optical wavelength conversion of 160, 320 and 640 Gbit/s line-rate data signals using four-wave mixing in a 3.6 mm long silicon waveguide. Bit error rate measurements validate the performance within FEC limits.
Keywords :
error statistics; optical wavelength conversion; waveguides; all-optical wavelength conversion; bit error rate measurement; bit rate 160 Gbit/s; bit rate 320 Gbit/s; bit rate 640 Gbit/s; data signal; silicon chip; silicon waveguide; size 3.6 mm; Bit error rate; Optical fibers; Optical signal processing; Optical wavelength conversion; Silicon; Wavelength measurement;
Conference_Titel :
Optical Fiber Communication Conference and Exposition (OFC/NFOEC), 2011 and the National Fiber Optic Engineers Conference
Conference_Location :
Los Angeles, CA
Print_ISBN :
978-1-4577-0213-6
