DocumentCode :
1596178
Title :
Surface plasmon resonance for digital imaging
Author :
Cumming, David R S ; Chen, Qin ; Walls, Kirsty ; Drysdale, Timothy D. ; Collins, Stephen ; Das, Dipayan ; Chitnis, Danial
Author_Institution :
Sch. of Eng., Univ. of Glasgow, Glasgow, UK
fYear :
2012
Firstpage :
1
Lastpage :
2
Abstract :
We present the design, implementation and test of a CMOS image sensor filter technology based on the exploitation of surface plasmon resonance. We demonstrate precise design and control of the spectral response of filters made in a single aluminium film. The film is patterned using electron beam lithography and reactive ion etching. Unlike conventional filter technology for CMOS, all the desired colour responses can be obtained in a single lithographic sequence. We show that the photocurrent from the sensors has the required spectral response after fabrication.
Keywords :
CMOS image sensors; aluminium; electron beam lithography; filters; metallic thin films; photoconductivity; photoemission; surface plasmon resonance; Al; CMOS image sensor filter technology; conventional filter technology; digital imaging; electron beam lithography; photocurrent; reactive ion etching; single aluminium film; single lithographic sequence; spectral response; surface plasmon resonance; CMOS integrated circuits; CMOS technology; Films; Lithography; Production; Lithography; digital imaging; plasmonics;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Nanotechnology (IEEE-NANO), 2012 12th IEEE Conference on
Conference_Location :
Birmingham
ISSN :
1944-9399
Print_ISBN :
978-1-4673-2198-3
Type :
conf
DOI :
10.1109/NANO.2012.6321896
Filename :
6321896
Link To Document :
بازگشت