DocumentCode
1596344
Title
Effect of the geometry on the aging of metalized polypropylene film capacitors
Author
El-Husseini, M.H. ; Venet, P. ; Rojat, G. ; Fathallah, M.
Author_Institution
CEGELY-UCBL, UMR-CNRS, Villeurbanne, France
Volume
4
fYear
2001
fDate
6/23/1905 12:00:00 AM
Firstpage
2061
Abstract
Aging of MPPF capacitors have been studied in this paper with the aim to improve their reliability regarding their design. The statistical approach showed that the failure mode may be represented by two parameter Weibull distribution and the experimental approach proved that a long capacitor deteriorates faster than a plate-shaped capacitor having the same features
Keywords
Weibull distribution; ageing; capacitors; metallisation; polymer films; statistical analysis; thin film capacitors; aging; failure mode; geometry effect; long capacitor; metalized polypropylene film capacitors; plate-shaped capacitor; reliability improvement; self-healing mechanism; statistical approach; two parameter Weibull distribution; Aging; Capacitors; Failure analysis; Geometry; Manufacturing; Optical films; Power system reliability; Power system security; Stress; Testing;
fLanguage
English
Publisher
ieee
Conference_Titel
Power Electronics Specialists Conference, 2001. PESC. 2001 IEEE 32nd Annual
Conference_Location
Vancouver, BC
ISSN
0275-9306
Print_ISBN
0-7803-7067-8
Type
conf
DOI
10.1109/PESC.2001.954424
Filename
954424
Link To Document